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FINAL
COM'L: -10/15/20
IND: -18/24
MACH230-10/15/20
High-Density EE CMOS Programmable Logic
DISTINCTIVE CHARACTERISTICS
84 Pins 128 Macrocells 10 ns tPD Commercial 18 ns tPD Industrial 100 MHz fCNT 70 Inputs 64 Outputs
Lattice Semiconductor
128 Flip-flops; 4 clock choices 8 "PAL26V16" blocks with buried macrocells Pin-compatible with MACH130, MACH131, MACH231, and MACH435
GENERAL DESCRIPTION
The MACH230 is a member of the high-performance EE CMOS MACH 2 device family. This device has approximately twelve times the logic macrocell capability of the popular PAL22V10 without loss of speed. The MACH230 consists of eight PAL blocks interconnected by a programmable switch matrix. The switch matrix connects the PAL blocks to each other and to all input pins, providing a high degree of connectivity between the fully-connected PAL blocks. This allows designs to be placed and routed efficiently. The MACH230 has two kinds of macrocell: output and buried. The output macrocell provides registered, latched, or combinatorial outputs with programmable polarity. If a registered configuration is chosen, the register can be configured as D-type or T-type to help reduce the number of product terms. The register type decision can be made by the designer or by the software. All output macrocells can be connected to an I/O cell. If a buried macrocell is desired, the internal feedback path from the macrocell can be used, which frees up the I/O pin for use as an input. The MACH230 has dedicated buried macrocells which, in addition to the capabilities of the output macrocell, also provide input registers for use in synchronizing signals and reducing setup time requirements.
BLOCK DIAGRAM
If you would like to view Block Diagram in full size, please click on the box.
Publication# 14132 Rev. I Issue Date: May 1995
Amendment /0
I/O0 - I/O7 (Block A)
I/O8 - I/O15 (Block B)
I/O16 - I/O23 (Block C)
I/O24 - I/O31 (Block D)
I2, I5
8 I/O Cells 8 Macrocells 8 8 Macrocells I/O Cells 8 Macrocells
8 8 8 Macrocells I/O Cells 8 Macrocells
8 8 8 Macrocells I/O Cells 8 Macrocells
8 8 8 Macrocells 4 2
OE 52 x 68 AND Logic Array and Logic Allocator 26
Siblings
OE 52 x 68 AND Logic Array and Logic Allocator 26
Siblings
OE 52 x 68 AND Logic Array and Logic Allocator 26 Switch Matrix 26 52 x 68 AND Logic Array and Logic Allocator OE
Siblings
OE 52 x 68 AND Logic Array and Logic Allocator 26
Siblings
26 52 x 68 AND Logic Array and Logic Allocator OE
26 52 x 68 AND Logic Array and Logic Allocator OE
26 52 x 68 AND Logic Array and Logic Allocator OE 4
Macrocells 8 I/O Cells 8 8
Macrocells 8
Macrocells 8 I/O Cells
Macrocells 8 8
Macrocells 8 I/O Cells 8
Macrocells 8
Macrocells 8 I/O Cells 8
Macrocells 8
4
8
8
8
I/O56 - I/O63 (Block H)
I/O48 - I/O55 (Block G)
I/O40 - I/O47 (Block F)
I/O31 - I/O39 (Block E)
CLK0/I0, CLK1/I1 CLK2/I3, CLK3/I4
14132I-1
CONNECTION DIAGRAM Top View
84 PLCC
VCC GND I/O7 I/06 I/O3 I/O2 I/O58 I/O57 I/O56 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 I/O24 I/O25 I/O28 I/O29 I/O30 I/O26 I/O27 I/O34 I/O35 I/O36 I/O37 I/O38 I/O39 VCC I/O32 I/O33 I/O31 I2 VCC GND GND I/O61 I/O60 I/O59 I/O5 I/O4 I/O63 I/O62 GND I/O1 I/O0 VCC I5
11 10 9 I/O8 I/O9 I/O10 I/O11 I/O12 I/O13 I/O14 I/O15 CLK0/I0 VCC GND CLK1/I1 I/O16 I/O17 I/O18 I/O19 I/O20 I/O21 I/O22 I/O23 GND 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
87
6
5
4
3 2 1 84 83 82 81 80 79 78 77 76 75 GND I/O55 I/O54 I/O53 I/O52 I/O51 I/O50 I/O49 I/O48 CLK3/I4 GND VCC CLK2/I3 I/O47 I/O46 I/O45 I/O44 I/O43 I/O42 I/O41 I/O40
14132I-2
Note: Pin-compatible with MACH130, MACH131, MACH231, and MACH435.
PIN DESIGNATIONS
CLK/I = GND = I = I/O = VCC Clock or Input Ground Input Input/Output
= Supply Voltage
MACH230-10/15/20
3
ORDERING INFORMATION Commercial Products
Programmable logic products for commercial applications are available with several ordering options. The order number (Valid Combination) is formed by a combination of:
MACH
230 -10
J
C
FAMILY TYPE MACH = Macro Array CMOS High-Speed
OPTIONAL PROCESSING Blank = Standard Processing OPERATING CONDITIONS C = Commercial (0C to +70C)
DEVICE NUMBER 230 = 128 Macrocells, 84 Pins SPEED -10 = 10 ns tPD -15 = 15 ns tPD -20 = 20 ns tPD
PACKAGE TYPE J = 84-Pin Plastic Leaded Chip Carrier (PL 084)
Valid Combinations MACH230-10 MACH230-15 MACH230-20 JC
Valid Combinations The Valid Combinations table lists configurations planned to be supported in volume for this device. Consult your local sales office to confirm availability of specific valid combinations and to check on newly released combinations.
4
MACH230-10/15/20 (Com'l)
ORDERING INFORMATION Industrial Products
Programmable logic products for industrial applications are available with several ordering options. The order number (Valid Combination) is formed by a combination of:
MACH
230 -18
J
I
FAMILY TYPE MACH = Macro Array CMOS High-Speed
OPTIONAL PROCESSING Blank = Standard Processing OPERATING CONDITIONS I = Industrial (-40C to +85C)
DEVICE NUMBER 230 = 128 Macrocells, 84 Pins SPEED -18 = 18 ns tPD -24 = 24 ns tPD
PACKAGE TYPE J = 84-Pin Plastic Leaded Chip Carrier (PL 084)
Valid Combinations MACH230-18 MACH230-24 JI
Valid Combinations The Valid Combinations table lists configurations planned to be supported in volume for this device. Consult your local sales office to confirm availability of specific valid combinations and to check on newly released combinations.
MACH230-18/24 (Ind)
5
FUNCTIONAL DESCRIPTION
The MACH230 consists of eight PAL blocks connected by a switch matrix. There are 64 I/O pins and 2 dedicated input pins feeding the switch matrix. These signals are distributed to the four PAL blocks for efficient design implementation. There are 4 clock pins that can also be used as dedicated inputs.
configures the logic allocator when fitting the design into the device. Table 2 illustrates which product term clusters are available to each macrocell within a PAL block. Refer to Figure 1 for cluster and macrocell numbers. Table 2. Logic Allocation
Macrocell Output Buried M0 M1 M2 M3 M4 M5 M6 M7 M8 M9 M10 M11 M12 M13 M14 M15 Available Clusters C0, C1, C2 C0, C1, C2, C3 C1, C2, C3, C4 C2, C3, C4, C5 C3, C4, C5, C6 C4, C5, C6, C7 C5, C6, C7, C8 C6, C7, C8, C9 C7, C8, C9, C10 C8, C9, C10, C11 C9, C10, C11, C12 C10, C11, C12, C13 C11, C12, C13, C14 C12, C13, C14, C15 C13, C14, C15 C14, C15
The PAL Blocks
Each PAL block in the MACH230 (Figure 1) contains a 64-product-term logic array, a logic allocator, 8 output macrocells, 8 buried macrocells, and 8 I/O cells. The switch matrix feeds each PAL block with 26 inputs. This makes the PAL block look effectively like an independent "PAL26V16" with 8 buried macrocells. In addition to the logic product terms, two output enable product terms, an asynchronous reset product term, and an asynchronous preset product term are provided. One of the two output enable product terms can be chosen within each I/O cell in the PAL block. All flip-flops within the PAL block are initialized together.
The Switch Matrix
The MACH230 switch matrix is fed by the inputs and feedback signals from the PAL blocks. Each PAL block provides 16 internal feedback signals and 8 I/O feedback signals. The switch matrix distributes these signals back to the PAL blocks in an efficient manner that also provides for high performance. The design software automatically configures the switch matrix when fitting a design into the device. The MACH230 places a restriction on buried macrocell feedback only. Buried macrocell feedback from one block can be used as an input only to that block or its "sibling" block. Sibling blocks are illustrated in the block diagram and in Table 1. Output macrocell feedback is not restricted. Table 1. Sibling Blocks
PAL Block A B C D E F G H Sibling Block H G F E D C B A
The Macrocell
The MACH230 has two types of macrocell: output and buried. The output macrocells can be configured as either registered, latched, or combinatorial, with programmable polarity. The macrocell provides internal feedback whether configured with or without the flipflop. The registers can be configured as D-type or T-type, allowing for product-term optimization. The flip-flops can individually select one of four clock/ gate pins, which are also available as data inputs. The registers are clocked on the LOW-to-HIGH transition of the clock signal. The latch holds its data when the gate input is HIGH, and is transparent when the gate input is LOW. The flip-flops can also be asynchronously initialized with the common asynchronous reset and preset product terms. The buried macrocells are the same as the output macrocells if they are used for generating logic. In that case, the only thing that distinguishes them from the output macrocells is the fact that there is no I/O cell connection, and the signal is only used internally. The buried macrocell can also be configured as an input register or latch.
The Product-Term Array
The MACH230 product-term array consists of 64 product terms for logic use, and 4 special-purpose product terms. Two of the special-purpose product terms provide programmable output enable, one provides asynchronous reset, and one provides asynchronous preset.
The I/O Cell
The I/O cell in the MACH230 consists of a three-state output buffer. The three-state buffer can be configured in one of three ways: always enabled, always disabled, or controlled by a product term. If product term control is chosen, one of two product terms may be used to provide the control. The two product terms that are available are common to all I/O cells in a PAL block. These choices make it possible to use the macrocell as an output, an input, a bidirectional pin, or a three-state output for use in driving a bus.
The Logic Allocator
The logic allocator in the MACH230 takes the 64 logic product terms and allocates them to the 16 macrocells as needed. Each macrocell can be driven by up to 16 product terms. The design software automatically 6
MACH230-10/15/20
0
4
8
12
16
20
24
28
32
36
40
43
47
51 Output Enable Output Enable Asynchronous Reset Asynchronous Preset
M0
Output Macro Cell
I/O Cell
I/O
M1
Buried Macro Cell
M2
Output Macro Cell
I/O Cell
I/O
M3
0
Buried Macro Cell
C0 C1 C2 C3 C4 C5 Logic Allocator
I/O Cell
M4
Output Macro Cell
I/O
M5
Buried Macro Cell
I/O Cell
I/O
M6
Output Macro Cell
Switch Matrix
C6 C7 C8 C9
M7
Buried Macro Cell
M8
Output Macro Cell
I/O Cell
I/O
C10 C11 C12 C13 C14 C15
63
M9
Buried Macro Cell
M10
Output Macro Cell
I/O Cell
I/O
M11
Buried Macro Cell
M12
Output Macro Cell
I/O Cell
I/O
M13
Buried Macro Cell
I/O Cell
I/O
M14
Output Macro Cell
M15
CLK
Buried Macro Cell
4
0
4
8 16
12
16
20
24
28
32
36
40
43
47
51
8
14132I-3
Figure 1. MACH230 PAL Block
MACH230-10/15/20
7
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . -65C to +150C Ambient Temperature With Power Applied . . . . . . . . . . . . . -55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = 0C to 70C) . . . . . . . . . . . . . . . . . . . . . 200 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . 0C to +70C Supply Voltage (VCC) with Respect to Ground . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input HIGH Current Input LOW Current Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current Test Conditions IOH = -3.2 mA, VCC = Min VIN = VIH or VIL IOL = 16 mA, VCC = Min VIN = VIH or VIL Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) VIN = 0 V, Outputs Open (IOUT = 0 mA) VCC = 5.0 V, f = 25 MHz, TA = 25C (Note 4) -30 235 2.0 0.8 10 -10 10 -10 -130 Min 2.4 0.5 Typ Max Unit V V V V A A A A mA mA
Notes: 1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 4. This parameter is measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and capable of being loaded, enabled, and reset.
8
MACH230-10 (Com'l)
CAPACITANCE (Note 1)
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance Test Conditions VIN = 2.0 V VOUT = 2.0 V VCC = 5.0 V, TA = 25C f = 1 MHz Typ 6 8 Unit pF pF
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges
Parameter Symbol tPD tS tH tCO tWL tWH -10 Parameter Description Input, I/O, or Feedback to Combinatorial Output D-type Setup Time from Input, I/O, or Feedback to Clock Register Data Hold Time Clock to Output Clock Width External Feedback fMAX Maximum Frequency LOW HIGH D-type T-type D-type Internal Feedback (fCNT) No Feedback tSL tHL tGO tGWL tPDL tSIR tHIR tICO tICS Setup Time from Input, I/O, or Feedback to Gate Latch Data Hold Time Gate to Output Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input or Output Latch Input Register Setup Time Input Register Hold Time Input Register Clock to Combinatorial Output Input Register Clock to Output Register Setup D-type T-type tWICL tWICH fMAXIR tSIL tHIL tIGO tIGOL tSLL Input Register Clock Width Maximum Input Register Frequency Input Latch Setup Time Input Latch Hold Time Input Latch Gate to Combinatorial Output Input Latch Gate to Output Through Transparent Output Latch Setup Time from Input, I/O, or Feedback Through Transparent Input Latch to Output Latch Gate 10 LOW HIGH 11 12 4 4 125 2 2.5 17 18 2 2.5 15.5 4 14 T-type 4 4 77 72 100 91 125 8 0 7.5 T-type 6.5 7.5 0 6.5 Min Max 10 Unit ns ns ns ns ns ns ns MHz MHz MHz MHz MHz ns ns ns ns ns ns ns ns ns ns ns ns MHz ns ns ns ns ns
MACH230-10 (Com'l)
9
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges (continued)
Parameter Symbol tIGS tWIGL tPDLL tAR tARW tARR tAP tAPW tAPR tEA tER -10 Parameter Description Input Latch Gate to Output Latch Setup Input Latch Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input and Output Latches Asynchronous Reset to Registered or Latched Output Asynchronous Reset Width Asynchronous Reset Recovery Time Asynchronous Preset to Registered or Latched Output Asynchronous Preset Width Asynchronous Preset Recovery Time Input, I/O, or Feedback to Output Enable Input, I/O, or Feedback to Output Disable 10 10 15 15 10 10 18 Min 11 4 16 18 Max Unit ns ns ns ns ns ns ns ns ns ns ns
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
10
MACH230-10 (Com'l)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . -65C to +150C Ambient Temperature With Power Applied . . . . . . . . . . . . . -55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = 0C to 70C) . . . . . . . . . . . . . . . . . . . . . 200 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . 0C to +70C Supply Voltage (VCC) with Respect to Ground . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input HIGH Current Input LOW Current Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Typical) Test Conditions IOH = -3.2 mA, VCC = Min VIN = VIH or VIL IOL = 16 mA, VCC = Min VIN = VIH or VIL Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) VCC = 5 V, TA = 25C, f = 25 MHz (Note 4) -30 235 2.0 0.8 10 -10 10 -10 -130 Min 2.4 0.5 Typ Max Unit V V V V A A A A mA mA
Notes: 1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being loaded, enabled, and reset.
MACH230-15/20 (Com'l)
11
CAPACITANCE (Note 1)
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance Test Conditions VIN = 2.0 V VOUT = 2.0 V VCC = 5.0 V, TA = 25C f = 1 MHz Typ 6 8 Unit pF pF
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges (Note 2)
Parameter Symbol tPD tS tH tCO tWL tWH Parameter Description Input, I/O, or Feedback to Combinatorial Output (Note 3) D-type Setup Time from Input, I/O, or Feedback to Clock Register Data Hold Time Clock to Output (Note 3) Clock Width External Feedback fMAX Maximum Frequency (Note 1) 1/(tS + tCO) LOW HIGH D-type T-type D-type Internal Feedback (fCNT) No Feedback tSL tHL tGO tGWL tPDL tSIR tHIR tICO tICS Latch Data Hold Time Gate to Output (Note 3) Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input or Output Latch Input Register Setup Time Input Register Hold Time Input Register Clock to Combinatorial Output Input Register Clock to Output Register Setup D-type T-type tWICL tWICH fMAXIR tSIL tHIL tIGO tIGOL tSLL tIGS Input Register Clock Width Maximum Input Register Frequency Input Latch Setup Time Input Latch Hold Time Input Latch Gate to Combinatorial Output Input Latch Gate to Output Through Transparent Output Latch Setup Time from Input, I/O, or Feedback Through Transparent Input Latch to Output Latch Gate Input Latch Gate to Output Latch Setup 12 16 1/(tWICL + tWICH) LOW HIGH 15 16 6 6 83.3 2 2.5 20 22 15 21 2 2.5 18 20 21 8 8 62.5 2 3 25 27 6 17 2 3 23 1/(tWL + tWH) T-type 6 6 50 47.6 66.6 62.5 83.3 10 0 11 8 22 T-type 10 11 0 10 8 8 40 38.5 50 47.6 62.5 13 0 12 -15 Min Max 15 13 14 0 12 -20 Min Max 20 Unit ns ns ns ns ns ns ns MHz MHz MHz MHz MHz ns ns ns ns ns ns ns ns ns ns ns ns MHz ns ns ns ns ns ns
Setup Time from Input, I/O, or Feedback to Gate
12
MACH230-15/20 (Com'l)
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges (Note 2) (continued)
Parameter Symbol tWIGL tPDLL tAR tARW tARR tAP tAPW tAPR tEA tER -15 Parameter Description Input Latch Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input and Output Latches Asynchronous Reset to Registered or Latched Output Asynchronous Reset Width (Note 1) Asynchronous Reset Recovery Time (Note 1) Asynchronous Preset to Registered or Latched Output Asynchronous Preset Width (Note 1) Asynchronous Preset Recovery Time (Note 1) Input, I/O, or Feedback to Output Enable (Note 3) Input, I/O, or Feedback to Output Disable (Note 3) 15 10 15 15 15 10 20 20 15 20 20 Min 6 19 20 20 15 25 Max Min 8 24 25 -20 Max Unit ns ns ns ns ns ns ns ns ns ns
Notes: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where frequency may be affected. 2. See Switching Test Circuit for test conditions. 3. Parameters measured with 32 outputs switching.
MACH230-15/20 (Com'l)
13
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . -65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . -55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA =-40C to +85C) . . . . . . . . . . . . . . . . . . 200 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
INDUSTRIAL OPERATING RANGES
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . -40C to +85C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS over INDUSTRIAL operating ranges unless otherwise specified
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input HIGH Leakage Current Input LOW Leakage Current Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Typical) Test Conditions IOH = -3.2 mA, VCC = Min VIN = VIH or VIL IOL = 16 mA, VCC = Min VIN = VIH or VIL Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) VCC = 5 V, TA = 25C, f = 25 MHz (Note 4) -30 235 2.0 0.8 10 -10 10 -10 -130 Min 2.4 0.5 Typ Max Unit V V V V A A A A mA mA
Notes: 1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included. ). 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH 3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being loaded, enabled, and reset.
14
MACH230-18/24 (Ind)
CAPACITANCE (Note 1)
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance Test Conditions VIN = 2.0 V VOUT = 2.0 V VCC = 5.0 V, TA = 25C f = 1 MHz Typ 6 8 Unit pF pF
SWITCHING CHARACTERISTICS over INDUSTRIAL operating ranges (Note 2)
Parameter Symbol tPD tS tH tCO tWL tWH Parameter Description Input, I/O, or Feedback to Combinatorial Output (Note 3) D-type Setup Time from Input, I/O, or Feedback to Clock Register Data Hold Time Clock to Output (Note 3) Clock Width External Feedback fMAX Maximum Frequency (Note 1) 1/(tS + tCO) LOW HIGH D-type T-type D-type Internal Feedback (fCNT) No Feedback tSL tHL tGO tGWL tPDL tSIR tHIR tICO tICS tWICL tWICH fMAXIR tSIL tHIL tIGO tIGOL tSLL tIGS tWIGL tPDLL Latch Data Hold Time Gate to Output (Note 3) Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input or Output Latch Input Register Setup Time Input Register Hold Time Input Register Clock to Combinatorial Output Input Register Clock to Output Register Setup Input Register Clock Width Maximum Input Register Frequency Input Latch Setup Time Input Latch Hold Time Input Latch Gate to Combinatorial Output Input Latch Gate to Output Through Transparent Output Latch Setup Time from Input, I/O, or Feedback Through Transparent Input Latch to Output Latch Gate Input Latch Gate to Output Latch Setup Input Latch Gate Width LOW Input, I/O, or Feedback to Output Through Transparent Input and Output Latches 14.5 19.5 7.5 23 1/(tWICL + tWICH ) D-type T-type LOW HIGH 18 19.5 7.5 7.5 66.5 2.5 3.5 24 26.5 18 25.5 10 29 2.5 3.5 22 24 25.5 10 10 50 2.5 4 30 32.5 7.5 20.5 2.5 4 28 1/(tWL + tWH) T-type 7.5 7.5 40 38 53 44 66.5 12 0 13.5 10 26.5 T-type 12 13.5 0 12 10 10 32 30.5 38 34.5 50 16 0 14.5 -18 Min Max 18 16 17 0 14.5 -24 Min Max 24 Unit ns ns ns ns ns ns ns MHz MHz MHz MHz MHz ns ns ns ns ns ns ns ns ns ns ns ns MHz ns ns ns ns ns ns ns ns
Setup Time from Input, I/O, or Feedback to Gate
MACH230-18/24 (Ind)
15
SWITCHING CHARACTERISTICS over INDUSTRIAL operating ranges (Note 2) (continued)
Parameter Symbol tAR tARW tARR tAP tAPW tAPR tEA tER -18 Parameter Description Asynchronous Reset to Registered or Latched Output Asynchronous Reset Width (Note 1) Asynchronous Reset Recovery Time (Note 1) Asynchronous Preset to Registered or Latched Output Asynchronous Preset Width (Note 1) Asynchronous Preset Recovery Time (Note 1) Input, I/O, or Feedback to Output Enable (Note 3) Input, I/O, or Feedback to Output Disable (Note 3) 18 12 18 18 18 12 24 24 18 24 24 Min Max 24 24 18 30 Min -24 Max 30 Unit ns ns ns ns ns ns ns ns
Notes: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where frequency may be affected. 2. See Switching Test Circuit for test conditions. 3. Parameters measured with 32 outputs switching.
16
MACH230-18/24 (Ind)
TYPICAL CURRENT VS. VOLTAGE (I-V) CHARACTERISTICS
VCC = 5.0 V, TA = 25C
IOL (mA) 80 60 40 20 VOL (V) -1.0 -0.8 -0.6 -0.4 -0.2 -20 -40 -60 -80
14132I-4
.2
.4
.6
.8
1.0
Output, LOW
IOH (mA) 25 1 -3 -2 -1 -25 -50 -75 -100 -125 -150
14132I-5
2
3
4
5 VOH (V)
Output, HIGH II (mA)
20
VI (V)
-2 -1 -20 -40 -60 -80 -100
14132I-6
1
2
3
4
5
Input MACH230-10/15/20 17
TYPICAL ICC CHARACTERISTICS
VCC = 5 V, TA = 25C
300 275 250 225 200 175 150 125 100 75 50 25 0 0 10 20 30 40 50 60 70
14132I-7
MACH230
ICC (mA)
Frequency (MHz)
The selected "typical" pattern is a 16-bit up/down counter. This pattern is programmed in each PAL block and is capable of being loaded, enabled, and reset. Maximum frequency shown uses internal feedback and a D-type register.
18
MACH230-10/15/20
TYPICAL THERMAL CHARACTERISTICS
Measured at 25C ambient. These parameters are not tested.
Parameter Symbol jc ja jma Parameter Description Thermal impedance, junction to case Thermal impedance, junction to ambient Thermal impedance, junction to ambient with air flow 200 lfpm air 400 lfpm air 600 lfpm air 800 lfpm air Typ PLCC 5 20 17 14 12 10 Units C/W C/W C/W C/W C/W C/W
Plastic jc Considerations
The data listed for plastic jc are for reference only and are not recommended for use in calculating junction temperatures. The heat-flow paths in plastic-encapsulated devices are complex, making the jc measurement relative to a specific location on the package surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package. Furthermore, jc tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant temperature. Therefore, the measurements can only be used in a similar environment.
MACH230-10/15/20
19
SWITCHING WAVEFORMS
Input, I/O, or Feedback
VT tPD
Combinatorial Output
VT
14132I-8
Combinatorial Output
Input, I/O, or Feedback tS Clock VT tCO Registered Output
VT tH
Input, I/O, or Feedback tSL Gate tPDL VT Latched Out
VT tHL VT tGO VT
14132I-9
14132I-10
Registered Output
Latched Output (MACH 2, 3, and 4)
tWH Clock tWL Clock Width
14132I-11
Gate tGWS
VT
14132I-12
Gate Width (MACH 2, 3, and 4)
Registered Input tSIR Input Register Clock Combinatorial Output VT tICO
VT tHIR
Registered Input Input Register Clock VT Output Register Clock
VT
VT
tICS
VT
14132I-14
14132I-13
Registered Input (MACH 2 and 4)
Input Register to Output Register Setup (MACH 2 and 4)
Notes: 1. VT = 1.5 V. 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns-4 ns typical.
20
MACH230-10/15/20
SWITCHING WAVEFORMS
Latched In tSIL Gate
VT tHIL VT tIGO
Combinatorial Output
VT
14132I-15
Latched Input (MACH 2 and 4)
tPDLL Latched In Latched Out Input Latch Gate tIGOL VT
VT
tIGS Output Latch Gate
tSLL VT
14132I-16
Latched Input and Output (MACH 2, 3, and 4)
Notes: 1. VT = 1.5 V. 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns-4 ns typical.
MACH230-10/15/20
21
SWITCHING WAVEFORMS
tWICH Clock tWICL
14132I-17
VT
Input Latch Gate tWIGL
VT
14132I-18
Input Register Clock Width (MACH 2 and 4)
Input Latch Gate Width (MACH 2 and 4)
tARW Input, I/O, or Feedback tAR Registered Output VT tARR Clock VT
14132I-19
tAPW VT Input, I/O, or Feedback tAP Registered Output VT tAPR Clock VT
14132I-20
VT
Asynchronous Reset
Asynchronous Preset
Input, I/O, or Feedback tER Outputs VOH - 0.5V VOL + 0.5V
VT tEA VT
14132I-21
Output Disable/Enable
Notes: 1. VT = 1.5 V. 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns-4 ns typical.
22
MACH230-10/15/20
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS Must be Steady May Change from H to L May Change from L to H Don't Care, Any Change Permitted Does Not Apply OUTPUTS Will be Steady Will be Changing from H to L Will be Changing from L to H Changing, State Unknown Center Line is HighImpedance "Off" State
KS000010-PAL
SWITCHING TEST CIRCUIT
5V
S1
R1 Output R2 Test Point
CL
14132I-22
Commercial Specification tPD, tCO tEA tER S1 Closed Z H: Open Z L: Closed H Z: Open L Z: Closed 35 pF 300 5 pF 390 CL R1 R2
Measured Output Value 1.5 V 1.5 V H Z: VOH - 0.5 V L Z: VOL + 0.5 V
*Switching several outputs simultaneously should be avoided for accurate measurement.
MACH230-10/15/20
23
fMAX PARAMETERS
The parameter fMAX is the maximum clock rate at which the device is guaranteed to operate. Because the flexibility inherent in programmable logic devices offers a choice of clocked flip-flop designs, fMAX is specified for three types of synchronous designs. The first type of design is a state machine with feedback signals sent off-chip. This external feedback could go back to the device inputs, or to a second device in a multi-chip state machine. The slowest path defining the period is the sum of the clock-to-output time and the input setup time for the external signals (tS + tCO). The reciprocal, fMAX, is the maximum frequency with external feedback or in conjunction with an equivalent speed device. This fMAX is designated "fMAX external." The second type of design is a single-chip state machine with internal feedback only. In this case, flip-flop inputs are defined by the device inputs and flip-flop outputs. Under these conditions, the period is limited by the internal delay from the flip-flop outputs through the internal feedback and logic to the flip-flop inputs. This fMAX is designated "fMAX internal". A simple internal counter is a good example of this type of design; therefore, this parameter is sometimes called "fCNT." The third type of design is a simple data path application. In this case, input data is presented to the flip-flop and clocked through; no feedback is employed. Under these conditions, the period is limited by the sum of the data setup time and the data hold time (tS + tH). However, a lower limit for the period of each fMAX type is the minimum clock period (tWH + tWL). Usually, this minimum clock period determines the period for the third fMAX, designated "fMAX no feedback." For devices with input registers, one additional fMAX parameter is specified: fMAXIR. Because this involves no feedback, it is calculated the same way as fMAX no feedback. The minimum period will be limited either by the sum of the setup and hold times (tSIR + tHIR) or the sum of the clock widths (tWICL + tWICH). The clock widths are normally the limiting parameters, so that fMAXIR is specified as 1/(tWICL + tWICH). Note that if both input and output registers are use in the same path, the overall frequency will be limited by tICS. All frequencies except fMAX internal are calculated from other measured AC parameters. fMAX internal is measured directly.
CLK
CLK
(SECOND CHIP) LOGIC REGISTER LOGIC REGISTER
tS
t CO fMAX External; 1/(tS + tCO) CLK
tS
fMAX Internal (fCNT) CLK
LOGIC
REGISTER
REGISTER
LOGIC
tS
tSIR
tHIR fMAXIR ; 1/(tSIR + tHIR) or 1/(tWICL + tWICH)
14132I-23
fMAX No Feedback; 1/(tS + tH) or 1/(tWH + tWL)
24
MACH230-10/15/20
ENDURANCE CHARACTERISTICS
The MACH families are manufactured using our advanced Electrically Erasable process. This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the device can be erased and reprogrammed, a feature which allows 100% testing at the factory.
Endurance Characteristics
Parameter Symbol Parameter Description Min 10 tDR N Min Pattern Data Retention Time Max Reprogramming Cycles 20 100 Units Years Years Cycles Test Conditions Max Storage Temperature Max Operating Temperature Normal Programming Conditions
MACH230-10/15/20
25
INPUT/OUTPUT EQUIVALENT SCHEMATICS
VCC
100 k 1 k VCC
ESD Protection
Input
VCC
VCC
100 k
1 k
Preload Circuitry
Feedback Input
14132I-24
I/O
26
MACH230-10/15/20
POWER-UP RESET
The MACH devices have been designed with the capability to reset during system power-up. Following powerup, all flip-flops will be reset to LOW. The output state will depend on the logic polarity. This feature provides extra flexibility to the designer and is especially valuable in simplifying state machine initialization. A timing diagram and parameter table are shown below. Due to the synchronous operation of the power-up reset and the
Parameter Symbol tPR tS tWL
wide range of ways VCC can rise to its steady state, two conditions are required to insure a valid power-up reset. These conditions are: 1. The VCC rise must be monotonic. 2. Following reset, the clock input must not be driven from LOW to HIGH until all applicable input and feedback setup times are met.
Parameter Descriptions Power-Up Reset Time Input or Feedback Setup Time Clock Width LOW
Max 10 See Switching Characteristics
Unit s
VCC
Power 4V
tPR
Registered Output
tS
Clock
tWL
14132I-25
Power-Up Reset Waveform
MACH230-10/15/20
27
USING PRELOAD AND OBSERVABILITY
In order to be testable, a circuit must be both controllable and observable. To achieve this, the MACH devices incorporate register preload and observability. In preload mode, each flip-flop in the MACH device can be loaded from the I/O pins, in order to perform functional testing of complex state machines. Register preload makes it possible to run a series of tests from a known starting state, or to load illegal states and test for proper recovery. This ability to control the MACH device's internal state can shorten test sequences, since it is easier to reach the state of interest. The observability function makes it possible to see the internal state of the buried registers during test by overriding each register's output enable and activating the output buffer. The values stored in output and buried registers can then be observed on the I/O pins. Without this feature, a thorough functional test would be impossible for any designs with buried registers. While the implementation of the testability features is fairly straightforward, care must be taken in certain instances to insure valid testing. One case involves asynchronous reset and preset. If the MACH registers drive asynchronous reset or preset lines and are preloaded in such a way that reset or preset are asserted, the reset or preset may remove the preloaded data. This is illustrated in Figure 2. Care should be taken when planning functional tests, so that states that will cause unexpected resets and presets are not preloaded. Another case to be aware of arises in testing combinatorial logic. When an output is configured as combinatorial, the observability feature forces the output into registered mode. When this happens, all product terms are forced to zero, which eliminates all combinatorial data. For a straight combinatorial output, the correct value will be restored after the preload or observe function, and there will be no problem. If the function implements a combinatorial latch, however, it relies on feedback to hold the correct value, as shown in Fugure 3. As this value may change during the preload or observe operation, you cannot count on the data being correct after the operation. To insure valid testing in these cases, outputs that are combinatorial latches should not be tested immediately following a preload or observe sequence, but should first be restored to a known state. All MACH 2 devices support both preload and observability. Contact individual programming vendors in order to verify programmer support.
Reset Figure 3. Combinatorial Latch
14132I-27
Preloaded HIGH D Q1
Q
AR
Preloaded HIGH D Q2
Q
AR
On Preload Mode Off
Q1
AR
Q2
Figure 2. Preload/Reset Conflict
14132I-26
Set
28
MACH230-10/15/20
PHYSICAL DIMENSIONS* PL 084 84-Pin Plastic Leaded Chip Carrier (measured in inches)
1.185 1.195
1.150 1.156
.042 .056
.062 .083
1.185 1.195 1.150 1.156
Pin 1 I.D.
1.090 1.130 1.000 REF
.013 .021
.026 .032
.050 REF
.007 .013
.090 .130 .165 .180
SEATING PLANE
TOP VIEW
SIDE VIEW
16-038-SQ PL 084 DF79 8-1-95 ae
*For reference only. BSC is an ANSI standard for Basic Space Centering.
MACH230-10/15/20
33

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